Found 21 matching results
(CN → US)
HS Code | Product Description | Official Doc | Tariff Rate | Origin | Destination | Effective Date |
---|---|---|---|---|---|---|
9031100000 | Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this chapter; profile projectors; parts and accessories thereof: Machines for balancing mechanical parts | Doc | 55.0% | CN | US | 2025-05-12 |
9031200000 | Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this chapter; profile projectors; parts and accessories thereof: Test benches | Doc | 56.7% | CN | US | 2025-05-12 |
9031410020 | Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this chapter; profile projectors; parts and accessories thereof: Other optical instruments and appliances: For inspecting semiconductor wafers or devices (including integrated circuits) or for inspecting photomasks or reticles used in manufacturing semiconductor devices (including integrated circuits) For inspecting photomasks or reticles used in manufacturing semiconductor devices | Doc | 55.0% | CN | US | 2025-05-12 |
9031410040 | Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this chapter; profile projectors; parts and accessories thereof: Other optical instruments and appliances: For inspecting semiconductor wafers or devices (including integrated circuits) or for inspecting photomasks or reticles used in manufacturing semiconductor devices (including integrated circuits) For inspecting semiconductor wafers or devices: For wafers | Doc | 55.0% | CN | US | 2025-05-12 |
9031410060 | Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this chapter; profile projectors; parts and accessories thereof: Other optical instruments and appliances: For inspecting semiconductor wafers or devices (including integrated circuits) or for inspecting photomasks or reticles used in manufacturing semiconductor devices (including integrated circuits) For inspecting semiconductor wafers or devices: Other | Doc | 55.0% | CN | US | 2025-05-12 |
9031491000 | Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this chapter; profile projectors; parts and accessories thereof: Other optical instruments and appliances: Other: Profile projectors | Doc | 55.0% | CN | US | 2025-05-12 |
9031494000 | Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this chapter; profile projectors; parts and accessories thereof: Other optical instruments and appliances: Other: Coordinate-measuring machines | Doc | 55.0% | CN | US | 2025-05-12 |
9031497000 | Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this chapter; profile projectors; parts and accessories thereof: Other optical instruments and appliances: Other: For inspecting masks (other than photomasks) used in manufacturing semiconductor devices; for measuring surface particulate contamination on semiconductor devices | Doc | 55.0% | CN | US | 2025-05-12 |
9031499000 | Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this chapter; profile projectors; parts and accessories thereof: Other optical instruments and appliances: Other: Other | Doc | 55.0% | CN | US | 2025-05-12 |
9031804000 | Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this chapter; profile projectors; parts and accessories thereof: Other instruments, appliances and machines: Electron beam microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles | Doc | 55.0% | CN | US | 2025-05-12 |
9031808060 | Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this chapter; profile projectors; parts and accessories thereof: Other instruments, appliances and machines: Other Equipment for testing the characteristics of internal combustion engines: For testing electrical characteristics | Doc | 30.0% | CN | US | 2025-05-12 |
9031808070 | Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this chapter; profile projectors; parts and accessories thereof: Other instruments, appliances and machines: Other Equipment for testing the characteristics of internal combustion engines: Other | Doc | 30.0% | CN | US | 2025-05-12 |
9031808085 | Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this chapter; profile projectors; parts and accessories thereof: Other instruments, appliances and machines: Other Other | Doc | 30.0% | CN | US | 2025-05-12 |
9031902100 | Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this chapter; profile projectors; parts and accessories thereof: Parts and accessories: Of profile projectors | Doc | 55.0% | CN | US | 2025-05-12 |
9031904500 | Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this chapter; profile projectors; parts and accessories thereof: Parts and accessories: Of other optical instruments and appliances, other than test benches: Bases and frames for the coordinate-measuring machines of subheading 9031.49.40 | Doc | 55.0% | CN | US | 2025-05-12 |
9031905400 | Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this chapter; profile projectors; parts and accessories thereof: Parts and accessories: Of other optical instruments and appliances, other than test benches: Of optical instruments and appliances of subheading 9031.41 or 9031.49.70 | Doc | 55.0% | CN | US | 2025-05-12 |
9031905900 | Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this chapter; profile projectors; parts and accessories thereof: Parts and accessories: Of other optical instruments and appliances, other than test benches: Other | Doc | 55.0% | CN | US | 2025-05-12 |
9031907000 | Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this chapter; profile projectors; parts and accessories thereof: Parts and accessories: Other: Of articles of subheading 9031.80.40 | Doc | 55.0% | CN | US | 2025-05-12 |
9031909130 | Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this chapter; profile projectors; parts and accessories thereof: Parts and accessories: Other: Other Of machines for balancing mechanical parts | Doc | 55.0% | CN | US | 2025-05-12 |
9031909160 | Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this chapter; profile projectors; parts and accessories thereof: Parts and accessories: Other: Other Of test benches | Doc | 55.0% | CN | US | 2025-05-12 |
9031909195 | Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this chapter; profile projectors; parts and accessories thereof: Parts and accessories: Other: Other Other | Doc | 80.0% | CN | US | 2025-05-12 |
您好!很高兴为您提供海关关务咨询服务。您申报的商品为“测量器”,我已为您整理了详细的HS编码分类及关税信息,请您仔细核对:
总体说明: 您的商品归类在 9031章:测量、检验、校准或测试仪器、表、记录或控制仪器、其附件 下,该章涵盖了多种类型的测量仪器。
具体HS编码解析:
- 9031.10.00.00: 机器用于平衡机械零件。
- 含义: 用于平衡机械零件的机器,例如动平衡机、静平衡机等。
- 税率: 基础关税0.0%,加征关税25.0%,2025.4.2后加征关税30%,总税率55.0%。
- 9031.20.00.00: 测试台。
- 含义: 用于进行各种测试的平台或设备,例如发动机测试台、材料测试台等。
- 税率: 基础关税1.7%,加征关税25.0%,2025.4.2后加征关税30%,总税率56.7%。
- 9031.41.00.00: 其他光学仪器和设备:用于检查半导体晶圆或设备(包括集成电路)或用于检查半导体设备制造中使用的光掩模或网格。
- 含义: 用于半导体行业晶圆、集成电路、光掩模等检测的光学仪器。
- 税率: 基础关税0.0%,加征关税25.0%,2025.4.2后加征关税30%,总税率55.0%。
- 细分:
- 9031.41.00.20: 用于检查半导体晶圆或设备(包括集成电路)或用于检查半导体设备制造中使用的光掩模或网格。
- 9031.41.00.40: 用于检查半导体晶圆或设备(包括集成电路)或用于检查半导体设备制造中使用的光掩模或网格:用于晶圆。
- 9031.41.00.60: 用于检查半导体晶圆或设备(包括集成电路)或用于检查半导体设备制造中使用的光掩模或网格:其他。
- 9031.49.10.00: 其他光学仪器和设备:其他:投影仪。
- 含义: 用于半导体行业晶圆、集成电路、光掩模等检测的光学仪器。
- 税率: 基础关税0.0%,加征关税25.0%,2025.4.2后加征关税30%,总税率55.0%。
- 9031.49.40.00: 其他光学仪器和设备:其他:坐标测量机。
- 含义: 用于测量物体三维坐标的仪器。
- 税率: 基础关税0.0%,加征关税25.0%,2025.4.2后加征关税30%,总税率55.0%。
- 9031.49.70.00: 其他光学仪器和设备:其他:用于检查半导体设备制造中使用的掩模(非光掩模);用于测量半导体设备表面的颗粒污染。
- 含义: 用于半导体行业掩模、颗粒污染检测的光学仪器。
- 税率: 基础关税0.0%,加征关税25.0%,2025.4.2后加征关税30%,总税率55.0%。
- 9031.49.90.00: 其他光学仪器和设备:其他:其他。
- 含义: 不属于上述类别的其他光学仪器。
- 税率: 基础关税0.0%,加征关税25.0%,2025.4.2后加征关税30%,总税率55.0%。
- 9031.80.40.00: 其他仪器、设备和机器:配备专门用于处理和运输半导体晶圆或网格的设备的电子束显微镜。
- 含义: 用于半导体行业晶圆、网格处理的电子束显微镜。
- 税率: 基础关税0.0%,加征关税25.0%,2025.4.2后加征关税30%,总税率55.0%。
- 9031.80.80.60: 其他仪器、设备和机器:用于测试内燃机特性的设备:用于测试电气特性。
- 含义: 用于测试内燃机电气特性的仪器。
- 税率: 基础关税0.0%,加征关税0.0%,2025.4.2后加征关税30%,总税率30.0%。
- 9031.80.80.70: 其他仪器、设备和机器:用于测试内燃机特性的设备:其他。
- 含义: 用于测试内燃机其他特性的仪器。
- 税率: 基础关税0.0%,加征关税0.0%,2025.4.2后加征关税30%,总税率30.0%。
- 9031.80.80.85: 其他仪器、设备和机器:其他:其他。
- 含义: 不属于上述类别的其他仪器。
- 税率: 基础关税0.0%,加征关税0.0%,2025.4.2后加征关税30%,总税率30.0%。
- 9031.90.21.00: 部件和附件:投影仪的。
- 含义: 投影仪的零部件。
- 税率: 基础关税0.0%,加征关税25.0%,2025.4.2后加征关税30%,总税率55.0%。
- 9031.90.45.00: 部件和附件:其他光学仪器和设备的,非测试台:坐标测量机的底座和框架。
- 含义: 坐标测量机的底座和框架。
- 税率: 基础关税0.0%,加征关税25.0%,2025.4.2后加征关税30%,总税率55.0%。
- 9031.90.54.00: 部件和附件:其他光学仪器和设备的,非测试台:9031.41或9031.49.70的。
- 含义: 9031.41或9031.49.70的光学仪器的零部件。
- 税率: 基础关税0.0%,加征关税25.0%,2025.4.2后加征关税30%,总税率55.0%。
- 9031.90.59.00: 部件和附件:其他光学仪器和设备的,非测试台:其他。
- 含义: 其他光学仪器的零部件。
- 税率: 基础关税0.0%,加征关税25.0%,2025.4.2后加征关税30%,总税率55.0%。
- 9031.90.70.00: 部件和附件:其他:9031.80.40的。
- 含义: 9031.80.40的零部件。
- 税率: 基础关税0.0%,加征关税25.0%,2025.4.2后加征关税30%,总税率55.0%。
- 9031.90.91.30: 部件和附件:其他:平衡机械零件的机器的。
- 含义: 平衡机械零件的机器的零部件。
- 税率: 基础关税0.0%,加征关税25.0%,2025.4.2后加征关税30%,总税率55.0%。
- 9031.90.91.60: 部件和附件:其他:测试台的。
- 含义: 测试台的零部件。
- 税率: 基础关税0.0%,加征关税25.0%,2025.4.2后加征关税30%,总税率55.0%。
- 9031.90.91.95: 部件和附件:其他:其他。
- 含义: 其他零部件。
- 税率: 基础关税0.0%,加征关税25.0%,2025.4.2后加征关税30%,总税率80.0%。
重要提示:
- 材质影响: 9031.90.91.95的零部件,如果材质为钢、铝制品,加征关税为25%,总税率高达80.0%。
- 2025.4.2关税调整: 请注意,2025年4月2日后,部分商品的加征关税将调整为30%。
- 准确归类: 请务必根据您实际商品的具体功能、材质、用途等信息,选择最准确的HS编码。
- 认证要求: 部分测量仪器可能需要通过相关的认证(如CE认证、CCC认证等),具体要求请咨询相关部门。
建议:
- 提供详细资料: 为了确保准确归类,建议您提供更详细的商品资料,例如产品图片、技术参数、用途说明等。
- 核对材质和单价: 务必核对商品的材质和单价,以便准确计算关税。
- 提前准备认证: 提前了解并准备相关的认证,以免影响清关进度。
希望以上信息对您有所帮助!如有任何疑问,请随时联系我。